- Spreading out payments over time eliminates the upfront cost of equipment purchases
- Payments may be 100% tax deductible*, which yields you significant cash-savings
- It is cheaper to lease with Excedr than it is to buy outright
- Our worry-free repair coverage minimizes instrument downtime
- Excedr handles the admin work associated with equipment procurement and maintenance
- With the capital saved through our program, labs are better able to reinvest in their core business and operations (staffing, inventory, marketing/sales, etc.)
*Please consult your tax advisor to determine the full tax implications of leasing equipment.
All equipment brands/models are available
REQUEST A LEASE ESTIMATE
An alternative to light microscopes, electron microscopes use beams of electrons as the light source. Compared to visible light, electrons have significantly shorter wavelengths, around 100,000 times shorter to be more exact. This results in having much higher resolving power and higher magnification. This combination allows for an extremely high resolution of objects too small to be seen by normal microscopy methods. This powerful tool has allowed for analysis of submicron-sized objects down to their atomic position. Another major difference between electron and optical microscopes is that instead of glass lenses, electron microscopes use electron optical lens systems. An electron gun is used to aim and release the electron beam towards the sample that must be kept in a vacuum sealed chamber. The beam is then controlled and focused at a specific location using electrostatic and electromagnetic lenses. Electron microscopes do suffer from poor contrast, so staining is often used to achieve better clarity. Electron microscopes have been used to open up new fields of study in nanotechnologies. Mobile phones, plasma TV’s, drug research, and structural biology have all benefited from using electron microscopy.
Electron Microscopy Techniques, Methods, & Costs
Transmission Electron Microscope (TEM)
One of the most frequently used types of electron microscopes are transmission electron microscopes. The main components in a TEM are:
- Electron gun: Commonly a tungsten filament cathode with a condenser system used to focus the electron beam.
- Image-producing system: Consisting of objective lenses, specimen stage, and intermediate and projector lenses to focus the electrons.
- Image-recording system: Converts the electrons that are shot through the sample into an image that humans can see. Common systems will include fluorescent screens and digital cameras.
Scanning Electron Microscope
The second most common type of electron microscope that is used to look at the surface layer of nanoscale objects. In this technique, the beam of electrons is scanned across the area of the sample to produce an image. This specific scanning technique is referred to as raster scanning. The electron gun shoots the beam at the subject and a series of electromagnets move the beam back and forth over its surface until the entire surface is imaged. Unlike TEM where the electrons go through the sample, in scanning electron microscopes the electrons bounce off the surface of the material. These electrons are called secondary electrons, and a screen is placed specifically to catch them as they come off of the specimen. Though the image may have less resolution than those from TEM, scanning electron microscope sample preparation time is much shorter.
Scanning Transmission Electron Microscope
A subtype of TEM, scanning transmission electron microscopes rely on electrons passing through a thin sample. In scanning transmission electron microscopes, the electron beam is now focused into a fine point, around .05-.2 nanometers, before it is scanned over the entire object. Electron signals are collected point by point until a complete image of the surface is constructed. Also unique to scanning transmission electron microscopes is the aberration corrector. This serves to correct the electron signal’s aberrations that occur due to them going through electromagnetic lenses. In short, it increases the resolution and clarity of the image. The electrons then are analyzed by an electron energy loss spectrometer. It analyzes the energy that the electrons lose when they bounce off the sample.
Environmental Scanning Electron Microscopes (ESEM)
A subtype of a scanning electron microscope, environmental scanning electron microscopes differentiate themselves by being able to image both uncoated and wet specimens. This is important because it allows for samples to be viewed in their natural environment without much prior preparation. Most of ESEM’s procedures are the same as scanning electron microscopy, however, key differences exist in the electron detection, beam transfer, and environmental condition management. Of particular note is in ESEM a differential pumping system and a gaseous detection device is used. The differential pumping system provides a high vacuum environment for the electron beam column, but leaves a separate high-pressure specimen chamber. Gaseous detection devices are employed to amplify the detection of secondary electron signals by utilizing gas ionization.
Reflection Electron Microscope
Unlike TEM and scanning electron microscopes, reflection electron microscopes do not analyze the transmission or the secondary electrons, instead it looks to analyze electron scattering. Electron scattering occurs when electrons bounce off of objects but do not lose any energy in the process. This technique is commonly coupled with reflection high energy electron diffraction and reflection high energy loss spectroscopy.
In 2017, the Nobel Prize in Chemistry was awarded to researchers Jacques Dubochet, Joachim Frank, and Richard Henderson “for developing cryo-electron microscopy for the high-resolution structure determination of biomolecules in solution.” Their developments allowed electron microscopes to view biological material without damaging or drastically altering it. Previously due to the powerful electron beams required for electron microscopy, any biological material being viewed would need to be dead. Joachim Frank developed the general method in the 1970s and 1980s. Jacques Dubochet was able to image biological samples in water in a vacuum without the water evaporating. Finally, Richard Henderson was able to prove the technology’s potential by imaging a 3D rendering of a protein on the atomic scale. These innovations have already majorly impacted the study of biological materials, being employed to better understand the Zika virus outbreak of the 2010s.
Electron microscopes of any kind are powerful tools for any lab, however, purchasing one can be incredibly onerous. Contact Excedr today to inquire about our comprehensive leasing program and avoid the large upfront cost of purchasing. Our leases also allow you to focus on your work while we take care of the repair and preventative maintenance coverage.
We Offer Real-Time Transmission Electron Microscope Leases to Fit Every Need
This off-balance sheet financing structure provides three options at the end of the term. The lessee has the option to return the equipment to the lessor, renew at a discounted rate, or purchase the instrument for the fair market value. Monthly payments are also 100% tax deductible which yields additional monetary savings.
If you recently bought equipment, Excedr can offer you cash for your device and convert your purchase into a long-term rental. This is called a sale leaseback. If you’ve paid for equipment within the last ninety days, we can help you recoup your investment and allow you to make low monthly payments. This also frees up money in your budget rather than tying it down to a fixed asset.
ELECTRON MICROSCOPE MANUFACTURERS & MODELS ON THE MARKET
- Thermo Fisher
Prisma E, Quattro ESEM, Apreo, Verios XHR, VolumeScope, Glacios Cryo-TEM, Themis S S/TEM, Themis ETEM, Metrios,Talos F200i, Talos L120C, Talos F200X, Talos F200S, Talos Arctica, Talos F200C, nProber III System, Scios 2 DualBeam, Aquilos Cryo-FIB, V400ACE, OptiFIB Taipan, Phenom Pharos, Phenom XL, Phenom ProX, Phenom Pro, PHenom Pure, Phenom GSR, VolumeScope 2, Metrios AX S/TEM, Krios G4 Cryo-TEM, Helios G4 PFIB HXe DualBeam, Phenom ParticleX AM, Phenom ParticleX TC, Phenom XL G2
FIB: Helios G4 PFIB HXe DualBeam, Helios G4 PFIB UXe FIB/SEM*, Helios G4 PFIB UXe DualBeam, Helios G4 PFIB CXe DualBeam FIB/SEM*, Helios G4 PFIB CXe DualBeam, Helios 5 Laser PFIB, V400ACE, OptiFIB Taipan, Vion
3View, GeminiSEM, Sigma Family, Sigma 300, Sigma 500, MultiSEM, MultiSEM 505, MultiSEM 506, EVO Family, EVO 10, EVO 15, EVO 25, ParticleSCAN VP, Crossbeam Family, Crossbeam 340, Crossbeam 550
Ion Microscope: ORION NanoFab
SU9000, Regulus series, SU7000, SU5000, SU3500, FlexSEM 1000, FLexSEM 1000 II, TM4000, TM4000Plus, HF-3300, HF5000, H-9500, HD-2700, HT7800 Series, NX5000, NX9000, NX2000,SU3800, SU3900, NX5000, NX9000, NX2000
Atomic Force Microscope: AFM5100N, AFM5300E, AFM5500M
- Nikon: NeoScope JCM-6000Plus
Atomic Force Microscope: Dimension XR, Dimension Icon, Dimension FastScan, Dimension FastScan Bio, Dimension FastScan Pro, Dimension Edge, Dimension Edge PSS, Dimension Icon-Raman, MultiMode 8-HR, Innova, BioScope Resolve, BioScope Resolve, Innova Iris, InSight CAP, InSight AFP
- Tescan: TESCAN VEGA, TESCAN MIRA, TESCAN CLARA, TESCAN MAGNA, TESCAN CLARA CRYO, TESCAN TIMA, TESCAN AMBER X, TESCAN AMBER, TESCAN AMBER CRYO, TESCAN SOLARIS, TESCAN SOLARIS X
InTouchScope series, JSM-IT500HR InTouchScope, JSM-IT500 InTouchScope, JSM-IT200InTouchScope, JSM-7900F, JSM-7610FPlus, JCM-7000 NeoScope, JEM-1400Flash, NEOARM, ARM200F, JEM-F200 F2, JEM-2200FS, JEM-2100Plus, CRYO ARM200, JSM-F100, JEM-ARM300F, CRYO ARM300
FIB: JIB-4700F, JIB-4000PLUS
- Nanoimages: SNE-3200M, SNE-4500M, SNE-4500M Plus,
- NT-MDT Spectrum Instruments
Atomic Force Microscope: NTEGRA, NEXT II, SOLVER Nano, VEGA,
Atomic Force Microscope: alpha300 A
Scanning Near-Field Optical Microscope (SNOM): alpha300 S
Atomic Force Microscope: CoreAFM, Flex-Axiom, Flex-Bio, NaioAFM
Scanning-Tunneling Microscope: NaioSTM
Fluidic Probe Microscope: FluidFM
- Elmitec: LEEM, SPELEEM, LEEM III, LEEM IV, LEEM V, PEEM, PEEM III
- Pemtron Corp.: PS Series
- Seron Technologies: AURA 100, AURA 200, AIS1800C, AIS2000C, AIS2100C, AIS2300C, AIS2500C, SEMIRON5000, REVIEW SEM, HYBRID COMPLEX XEM
- and more!
REQUEST A LEASE ESTIMATE
Effect on Credit & Operating Capital
Leasing/renting does not hinder your future borrowing ability and allows you to keep your business credit line open for expansions, staffing, and other operational expenses. Additionally, it strengthens the cash flow of your business and keeps cash reserves free for business development opportunities.
Unlike traditional financing and leasing companies, the Excedr program can accommodate refurbished/reconditioned equipment in addition to demo units. If you are looking for additional cost-savings, we recommend considering this option.
Speed of Approval
Excedr’s program allows you to respond quickly as your need for equipment and technology arises. You can be approved with minimal documentation and have the equipment you need in operation and generating revenue for your business quickly.